Power law for frequency-dependence of double layer capacitance of graphene flakes

• 資料種別: 文書・図像類
• タイトル: Power law for frequency-dependence of double layer capacitance of graphene flakes
• 著者・編者: Wang, Hongxin; Aoki, Koichi Jeremiah; Chen, Jingyuan; Nishiumi, Toyohiko; Zeng, Xiangdong; Ma, Xiuyuan
• 著者標目: Wang, Hongxin; Aoki, Koichi Jeremiah; Chen, Jingyuan; Nishiumi, Toyohiko; Zeng, Xiangdong; Ma, Xiuyuan
• 出版事項: Elsevier B.V.
• 出版年月日等: 2015-02
• 出版年（W3CDTF）: 2015-02
• タイトル（掲載誌）: Journal of Electroanalytical Chemistry
• 巻号年月日等（掲載誌）: 741
• 掲載巻: 741
• 掲載ページ: 114-119
• ISSN（掲載誌）: ISSN : 1572-6657
• 本文の言語コード: eng
• 件名標目: Double layer capacitance of graphene films; Frequency-dispersion; Constant phase element; Density of graphene
• 対象利用者: 一般
• 一般注記: The double layer capacitance per weight of graphene (GN) flakes in aqueous solution at the polarized potential increases with a decrease in the ac-frequency, obeying the inverse of the power law of the frequency. The power law is demonstrated to be equivalent to the constant phase element. The frequency-dependence increases with the thickness of the GN films. Thus, the lower the frequency and the thinner the film is, the larger is the capacitance density per weight. This is confirmed by cyclic voltammetry for several thickness of GN films and several scan rates. Resistance-like voltammograms at thick films are caused by frequencydispersioIEEE TRANSACTIONS ON ELECTRON DEVICESn. The overall capacitive properties of the GN films are as follows: the thickness of one GN flake is estimated to be 2 nm in average from the comparison of the thickness with the capacitances at the HOPG, which is consistent with values by the STM and AFM images.
• オンライン閲覧公開範囲: 限定公開
• 著作権情報: 〓 2015 Elsevier B.V.
• 関連情報（DOI）: 10.1016/j.jelechem.2015.01.008
• 連携機関・データベース: 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）; https://irdb.nii.ac.jp
• 提供元機関・データベース: 福井大学 : 福井大学学術機関リポジトリ