並列タイトル等Dual Correlated Randam Excitation Technique for Modal Testing
タイトル(掲載誌)航空宇宙技術研究所報告 = Technical Report of National Aerospace Laboratory TR-762
一般注記A dual correlated random excitation technique is presented for estimating the modal parameters of symmetric structures. In this procedure, a pure random signal is used to drive each of two identical excitation systems located at symmetric positions of the structure in order to reduce the number of degrees of freedom in a given measurement by separating symmetric and anti-symmetric vibration modes. Experimental results indicate that although the vibration modes are well separated, the resulting eigen frequencies are slightly shifted and the damping ratios are found higher compared to those estimated by the conventional one point random excitation method.
資料番号: NALTR0762000
レポート番号: NAL TR-762
一次資料へのリンクURLhttps://jaxa.repo.nii.ac.jp/?action=repository_action_common_download&item_id=45020&item_no=1&attribute_id=31&file_no=1
連携機関・データベース国立情報学研究所 : 学術機関リポジトリデータベース(IRDB)(機関リポジトリ)
提供元機関・データベース宇宙航空研究開発機構 : 宇宙航空研究開発機構リポジトリ