並列タイトル等CRAY X-MPジョウ ノ ヒョウメン デンカホウ ト デンシ キドウ ケイサン
Surface Charge Method and Electron Ray Tracing on CRAY X-MP
タイトル(掲載誌)愛知工業大学研究報告. B, 専門関係論文集 = Bulletin of Aichi Institute of Technology. Part B
一般注記The surface charge method (SCM) is the precise electric field solver utilized for the numerical analysis of the electron optical devices, such as electron guns and lenses. Because of its long computing time, the SCM brings a serious problem when a large number of electron trajectories have to be calculated for the analysis. This paper describes the SCM and the electron ray tracing on the vector pipeline supercomputer CRAY X-MP/14se. The SCM-code was optimized for the parallel computation, and the effect on the ray tracing time was examined. The method and result are presented.
identifier:http://repository.aitech.ac.jp/dspace/handle/11133/890
一次資料へのリンクURLhttp://repository.aitech.ac.jp/dspace/bitstream/11133/890/1/%e7%b4%80%e8%a6%8127%e5%8f%b7B%28P11-16%29.pdf
連携機関・データベース国立情報学研究所 : 学術機関リポジトリデータベース(IRDB)(機関リポジトリ)