1999 IEEE international integrated reliability workshop final report -- : International integrated reliability workshop : 18th : Oct 1999, Lake Tahoe, CA.

• 資料種別: 図書
• ISBN: 0780356497 (pbk)
• タイトル: 1999 IEEE international integrated reliability workshop final report -- : International integrated reliability workshop : 18th : Oct 1999, Lake Tahoe, CA.
• 著者標目: IEEE. Electron Devices Society.; IEEE. Reliability Society.
• 出版事項: IEEE
• 出版年月日等: 1999.
• 出版年（W3CDTF）: 1999
• 数量: v.
• 並列タイトル等: Also known as IRW. IEEE cat no 99TH8460; integrated reliability ; electron devices ; semiconductor technology ; IEEE
• NDLC: M17
• 一般注記: Papers.; Also known as IRW. IEEE cat no 99TH8460.; Index term: integrated reliability ; electron devices ; semiconductor technology ; IEEE.; BL shelfmark: 4541.43065 1999.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-00-1891
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000003448352; http://id.ndl.go.jp/bib/000003448352
• UKMARC番号: G05981402
• 整理区分コード: 215