Photomechanics and speckle metrology : International conference : 31st Annual international technical symposium on optical and optoelectronic applied science and engineering : Aug 1987, San Diego, CA. (SPIE Proceedings ; 814)

Photomechanics and speckle metrology : International conference : 31st Annual international technical symposium on optical and optoelectronic applied science and engineering : Aug 1987, San Diego, CA.

(SPIE Proceedings ; 814)

国立国会図書館請求記号: M17-88-0700
国立国会図書館書誌ID: 000003471115

資料種別: 図書

著者: Society of Photo-Optical Instrumentation Engineers.ほか

出版者: SPIE - The International Society for Optical Engineering

出版年: 1988.

資料形態: 紙

ページ数・大きさ等: v.

NDC: -

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資料に関する注記

一般注記：: Papers.In 2 parts. Held as part of a four conference programme on precision instrument design.Index term: photomechanics ; speckle metrology ; optoele...

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紙

資料種別: 図書
ISBN: 0892528494 (pbk)
タイトル: Photomechanics and speckle metrology : International conference : 31st Annual international technical symposium on optical and optoelectronic applied science and engineering : Aug 1987, San Diego, CA.
シリーズタイトル: SPIE Proceedings ; 814
著者標目: Society of Photo-Optical Instrumentation Engineers.
Office of Naval Research.
出版事項: Bellingham, WA : SPIE - The International Society for Optical Engineering
出版年月日等: 1988.
出版年（W3CDTF）: 1988
数量: v.
並列タイトル等: In 2 parts. Held as part of a four conference programme on precision instrument design
photomechanics ; speckle metrology ; optoelectronic applied science ; SPIE
NDLC: M17
M191
一般注記: Papers.
In 2 parts. Held as part of a four conference programme on precision instrument design.
Index term: photomechanics ; speckle metrology ; optoelectronic applied science ; SPIE.
BL shelfmark: 6823.100 vol 814 pts 1-2 1988.
所蔵機関: 国立国会図書館
請求記号: M17-88-0700
連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
書誌ID（NDLBibID）: 000003471115
http://id.ndl.go.jp/bib/000003471115
UKMARC番号: G01081562
整理区分コード: 215