並列タイトル等Held as part of 44th International symposium on optical science, engineering, and instrumentation
tunable diode ; atmospheric studies ; SPIE ; industrial processing monitoring
一般注記Selected papers.
Held as part of 44th International symposium on optical science, engineering, and instrumentation.
Index term: tunable diode ; atmospheric studies ; SPIE ; industrial processing monitoring.
BL shelfmark: 6823.100 vol 3758 1999.