Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-6, 2002, Boston, Massachusetts, U.S.A. : symposium G, "spatially resolved characterization of local phenomena in materials and devices" : 2002 MRS fall meeting : Dec 2002, Boston, MA.

• 資料種別: 図書
• ISBN: 1558996753
• タイトル: Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-6, 2002, Boston, Massachusetts, U.S.A. : symposium G, "spatially resolved characterization of local phenomena in materials and devices" : 2002 MRS fall meeting : Dec 2002, Boston, MA.
• シリーズタイトル: Materials Research Society Symposia Proceedings ; 738
• タイトル標目: Materials Research Society symposia proceedings ; v. 738.
• 著者標目: Piqueras, Javier.; Symposium G, "Spatially Resolved Characterization of Local Phenomena in Materials and Devices" (2002 : Boston, Mass.)
• 出版事項: Warrendale : Materials Research Society
• 出版年月日等: c2003.
• 出版年（W3CDTF）: 2003
• 数量: xiii, 425 p. : ill. ; 24 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Nanotechnology -- Congresses.; Nanostructure materials -- Congresses.; Semiconductors -- Characterization -- Technique -- Congresses.; Scanning probe microscopy -- Congresses.
• NDLC: M17
• 一般注記: Papers.
• 書誌注記: Includes bibliographical references and indexes.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-03-5205
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000004164569; http://id.ndl.go.jp/bib/000004164569
• RLIN番号: CSUGA5430324-B
• 整理区分コード: 215