Fourth international symposium on quality electronic design : proceedings : 24-26 March 2003 : San Jose, California. : Mar 2003, San Jose, CA.

• 資料種別: 図書
• ISBN: 0769518818 (pbk.)
• タイトル: Fourth international symposium on quality electronic design : proceedings : 24-26 March 2003 : San Jose, California. : Mar 2003, San Jose, CA.
• 著者標目: International Symposium on Quality Electronic Design (4th : 2003 : San Jose, Calif.)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2003.
• 出版年（W3CDTF）: 2003
• 数量: xxi, 457 p. : ill. ; 28 cm.
• 並列タイトル等: 4th international symposium on quality electronic design : proceedings : 24-26 March 2003 : San Jose, California; Proceedings of the ISQED 2003 : 2003 4th international symposium on quality electronic design : 24-26 March 2003 : San Jose, California
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Reliability -- Congresses.; Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Integrated circuits -- Very large scale integration -- Computer-aided design -- Congresses.; Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
• LCC: TK7874.75
• NDLC: M17
• 一般注記: Program and papers.; IEEE cat no PR01881.
• 書誌注記: Includes bibliographical references and author index.
• 別の媒体に関する注記: Also available via the World Wide Web.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-04-125
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000004180607; http://id.ndl.go.jp/bib/000004180607
• LC control number: 2002116028; https://lccn.loc.gov/2002116028
• RLIN番号: NYCGAVR7548-B
• 整理区分コード: 215