Highly charged ions [microform] : publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland / editors, John D. Gillaspy ... [et al.]

• 資料種別: 図書
• タイトル: Highly charged ions [microform] : publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland / editors, John D. Gillaspy ... [et al.]
• シリーズタイトル: NIST special publication ; 972
• 著者標目: Gillaspy, John; National Institute of Standards and Technology (U.S.)
• 出版年（W3CDTF）: 2002
• 数量: 4 microfiches ; 11 x 15 cm
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 資料種別（注記）: [microform]
• 件名標目: Physics Laboratory (U.S.) . Atomic Physics Division -- Research; Trapped ions; Electron beams; Electron-ion collisions; Ion bombardment; Plasma radiation
• 一般注記: Government document call number: C 13.10: 972; Physical description for original version : xviii, 304 p. : ill. ; 28 cm; "July 2002."; Shipping list no.: 2003-0272-M; Reproduction note: Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2003. 4 microfiches : negative
• 書誌注記: Includes bibliographical references
• GPO管理番号: 0247 (MF)
• 原資料等に関する注記: 原資料の出版事項: Gaithersburg, MD ; Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology : For sale by the Supt. of Docs., U.S. G.P.O., [2002]
• 所蔵機関: 国立国会図書館
• 請求記号: YCA-C 13.10:972
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000004252582; http://id.ndl.go.jp/bib/000004252582
• RLIN番号: NJRGA1813874-B
• 整理区分コード: 281