Modern diffraction and imaging techniques in material science. Proceedings of the International Summer Course on Material Science, held at Antwerp, Belgium, 28 July-8 August 1969, and sponsored by NATO Scientific Affairs Division. Editors: S. Amelinckx, R. Gevers, G. Remaut [and others].

Modern diffraction and imaging techniques in material science. Proceedings of the International Summer Course on Material Science, held at Antwerp, Belgium, 28 July-8 August 1969, and sponsored by NATO Scientific Affairs Division. Editors: S. Amelinckx, R. Gevers, G. Remaut [and others].

国立国会図書館請求記号: ND448-6
国立国会図書館書誌ID: 000006228484

資料種別: 図書

著者: International Summer Course on Material Science (1969 : Antwerp, Belgium)ほか

出版者: North-Holland Pub. Co.

出版年: 1970.

資料形態: 紙

ページ数・大きさ等: viii, 746 p. with illus. 23 cm.

NDC: -

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一般注記：: "Sole distributors for the U.S.A. and Canada: American Elsevier, New York."

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資料種別: 図書
タイトル: Modern diffraction and imaging techniques in material science. Proceedings of the International Summer Course on Material Science, held at Antwerp, Belgium, 28 July-8 August 1969, and sponsored by NATO Scientific Affairs Division. Editors: S. Amelinckx, R. Gevers, G. Remaut [and others].
著者標目: International Summer Course on Material Science (1969 : Antwerp, Belgium)
Amelinckx, S. (Severin)
出版事項: Amsterdam : North-Holland Pub. Co.
出版年月日等: 1970.
出版年（W3CDTF）: 1970
数量: viii, 746 p. with illus. 23 cm.
出版地（国名コード）: NL
本文の言語コード: eng
件名標目: Electron microscopy -- Congresses.
Electrons -- Diffraction -- Congresses.
Imaging systems -- Congresses.
LCC: QH212.E4
DDC: 548/.83
NDLC: ND448
一般注記: "Sole distributors for the U.S.A. and Canada: American Elsevier, New York."
書誌注記: Includes bibliographical references.
所蔵機関: 国立国会図書館
請求記号: ND448-6
連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
書誌ID（NDLBibID）: 000006228484
http://id.ndl.go.jp/bib/000006228484
LC control number: 70113747
https://lccn.loc.gov/70113747
整理区分コード: 211