Radiation effects in electronics. (ASTM special technical publication no. 384)

Radiation effects in electronics.

(ASTM special technical publication no. 384)

国立国会図書館請求記号: 621.38-J74r
国立国会図書館書誌ID: 000006235170

資料種別: 図書

著者: American Nuclear Society. Niagara Finger Lakes Section.ほか

出版者: American Society for Testing and Materials

出版年: [1965]

資料形態: 紙

ページ数・大きさ等: 236 p. illus. 24 cm.

NDC: -

すべて見る

資料に関する注記

一般注記：: Consists of the major portion of the transactions of the joint meeting of ASTM Committee E-10 on Radioisotopes and Radiation Effects, and the Niagara-...

書店で探す

書誌情報

この資料の詳細や典拠（同じ主題の資料を指すキーワード、著者名）等を確認できます。

紙

資料種別: 図書
タイトル: Radiation effects in electronics.
シリーズタイトル: ASTM special technical publication no. 384
タイトル標目: American Society for Testing and Materials. Special technical publication ; no. 384.
著者標目: American Nuclear Society. Niagara Finger Lakes Section.
ASTM Committee E-10 on Radioisotopes and Radiation Effects.
Joint ANS-ASTM Conference on Radiation Effects in Electronics (1964 : Syracuse, N.Y.)
出版事項: Philadelphia : American Society for Testing and Materials
出版年月日等: [1965]
出版年（W3CDTF）: 1965
数量: 236 p. illus. 24 cm.
出版地（国名コード）: US
本文の言語コード: eng
件名標目: Semiconductors -- Effect of radiation on.
Electronic apparatus and appliances -- Effect of radiation on.
LCC: TK7872.S4
DDC: 621.38
621.38152
一般注記: Consists of the major portion of the transactions of the joint meeting of ASTM Committee E-10 on Radioisotopes and Radiation Effects, and the Niagara-Finger Lakes Section of the American Nuclear Society held in Syracuse, N.Y., Oct. 5-7, 1964.
書誌注記: Includes bibliographical references.
所蔵機関: 国立国会図書館
請求記号: 621.38-J74r
連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
書誌ID（NDLBibID）: 000006235170
http://id.ndl.go.jp/bib/000006235170
LC control number: 65018216
https://lccn.loc.gov/65018216
整理区分コード: 211