Applications of electron microfractography to materials research.

• 資料種別: 図書
• タイトル: Applications of electron microfractography to materials research.
• シリーズタイトル: ASTM special technical publication 493
• 著者標目: American Society for Testing and Materials. Subcommittee II on Fractography.; Symposium on Applications of Electron Microfractography to Materials Research, Toronto, 1970.
• 出版事項: Philadelphia : American Society for Testing and Materials
• 出版年月日等: [1971]
• 出版年（W3CDTF）: 1971
• 数量: 96 p. illus. 23 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Fractography -- Congresses.; Electron microscopy -- Congresses.
• LCC: TA460
• DDC: 620.1/6/6028
• NDLC: M215
• 一般注記: "Presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970."; Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals.
• 書誌注記: Includes bibliographical references.
• 所蔵機関: 国立国会図書館
• 請求記号: M215-36
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000006343934; http://id.ndl.go.jp/bib/000006343934
• LC control number: 70155959; https://lccn.loc.gov/70155959
• 整理区分コード: 211