Symposium on X-Ray and Electron Probe Analysis; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963. (ASTM special technical publication no. 349)

Symposium on X-Ray and Electron Probe Analysis; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.

(ASTM special technical publication no. 349)

国立国会図書館請求記号: 544.6-S989s
国立国会図書館書誌ID: 000006345205

資料種別: 図書

著者: ASTM Committee E-2 on Emission Spectroscopy.ほか

出版者: American Society for Testing and Materials

出版年: [1964]

資料形態: 紙

ページ数・大きさ等: vi, 209 p. illus. 24 cm.

NDC: -

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資料に関する注記

一般注記：: Sponsored jointly by ASTM Committees E-2 on Emission Spectroscopy and E-4 on Electron Metallography.

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資料種別: 図書
タイトル: Symposium on X-Ray and Electron Probe Analysis; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.
シリーズタイトル: ASTM special technical publication no. 349
タイトル標目: American Society for Testing and Materials. Special technical publication ; no. 349.
著者標目: ASTM Committee E-2 on Emission Spectroscopy.
American Society for Testing and Materials. Committee E-4 on Metallography.
Symposium on X-Ray and Electron Probe Analysis (1963 : Atlantic City)
出版事項: Philadelphia : American Society for Testing and Materials
出版年月日等: [1964]
出版年（W3CDTF）: 1964
数量: vi, 209 p. illus. 24 cm.
出版地（国名コード）: US
本文の言語コード: eng
件名標目: X-ray spectroscopy -- Congresses.
Probes (Electronic instruments) -- Congresses.
LCC: QD95
DDC: 544.6
一般注記: Sponsored jointly by ASTM Committees E-2 on Emission Spectroscopy and E-4 on Electron Metallography.
書誌注記: Includes bibliographies.
所蔵機関: 国立国会図書館
請求記号: 544.6-S989s
連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
書誌ID（NDLBibID）: 000006345205
http://id.ndl.go.jp/bib/000006345205
LC control number: 63021661
https://lccn.loc.gov/63021661
整理区分コード: 211