The Georgia Tech high sensitivity microwave measurement system [microform] / David R. Deboer and Paul G. Steffes ([NASA contractor report] ; CR-205257)
The Georgia Tech high sensitivity microwave measurement system [microform] / David R. Deboer and Paul G. Steffes
原資料の出版事項: [Washington, DC ; Springfield, Va. : National Aeronautics and Space Administration : National Technical Information Service, distributor, 1996]