Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass [microform] / Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze ([NASA technical memorandum] ; NASA/TM-1998-208826)
Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass [microform] / Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze
原資料の出版事項: [Cleveland, Ohio] ; Springfield, VA : National Aeronautics and Space Administration, Lewis Research Center : National Technical Information Service, distributor, [1998]