Effect of processing route on strain controlled low cycle fatigue behavior of polycrystalline NiAl [microform] / K. Bhanu Sankara Rao, B.A. Lerch, and R.D. Noebe
原資料の出版事項: [Washington, D.C. ; Springfield, Va. : National Aeronautics and Space Administration : National Technical Information Service, distributor, 1995]