Precision thickness variation mapping via one-transducer ultrasonic high resolution profilometry for sample with irregular or rough surface [microform] / Don J. Roth, inventor (NASA case ; no. LEW-16,228-1)
Precision thickness variation mapping via one-transducer ultrasonic high resolution profilometry for sample with irregular or rough surface [microform] / Don J. Roth, inventor
原資料の出版事項: [Washington, DC ; Springfield, Va. : National Aeronautics and Space Administration : National Technical Information Service, distributor, 1996]