Examination procedure outlines for commercial weighing and measuring devices [microform] : a manual for weights and measures officials / editor, G. Diane Lee

• 資料種別: 図書
• タイトル: Examination procedure outlines for commercial weighing and measuring devices [microform] : a manual for weights and measures officials / editor, G. Diane Lee
• 版: 2002 ed
• シリーズタイトル: NIST handbook ; 112
• 著者標目: National Institute of Standards and Technology (U.S.) . Office of Weights and Measures; Lee, G. Diane
• 出版年（W3CDTF）: 2002
• 数量: microfiche
• 大きさ: 11 × 15 cm
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 資料種別（注記）: [microform]
• 件名標目: Weights and measures -- United States -- Handbooks, manuals, etc; Weights and measures -- Law and legislation -- United States -- Handbooks, manuals, etc; Scales (Weighing instruments)
• 一般注記: "Supersedes Handbook 112, June 1973 edition."; "April 2002."; Shipping list no.: 2003-0004-M; Physical description for original version: 1 v. (various pagings) ; 28 cm
• 原資料等に関する注記: 原資料の出版事項: Gaithersburg, MD ; Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology : For sale by the Supt. of Docs., U.S. G.P.O., [2002]; SUPTDOC番号: C 13.11: 112; GPO管理番号: 0245 (MF)
• 所蔵機関: 国立国会図書館
• 請求記号: YCA-C 13.11:112
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000006644433; http://id.ndl.go.jp/bib/000006644433
• OCLC番号: 51330134; https://www.worldcat.org/oclc/51330134
• 整理区分コード: 281