The effects of finite sampling corrections on state assessment sample requirements [microform] / James R. Chromy ; commissioned by the NAEP Validity Studies (NVS) Panel

• 資料種別: 図書
• タイトル: The effects of finite sampling corrections on state assessment sample requirements [microform] / James R. Chromy ; commissioned by the NAEP Validity Studies (NVS) Panel
• 著者標目: Chromy, James R; American Institutes for Research; National Center for Education Statistics
• 出版年（W3CDTF）: 1998
• 数量: 1 microfiche ; 11 x 15 cm
• 並列タイトル等: At head of cover title: NAEP Validity Studies
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 資料種別（注記）: [microform]
• 件名標目: National Assessment of Educational Progress (Project); Sampling (Statistics); Educational tests and measurements -- United States -- Statistical methods; Educational evaluation -- United States -- Statistical methods
• 一般注記: Physical description for original version: 25 p; Government document call number: ED 1.310/2: 460134; Physical description for original version : 1 v; Shipping list no.: 2004-0336-M; Reproduction note: Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2004 1 microfiche
• GPO管理番号: 0466-A-03 (MF)
• 原資料等に関する注記: 原資料の出版事項: Palo Alto, CA : American Institutes for Research, [1998]
• 所蔵機関: 国立国会図書館
• 請求記号: YCA-ED 1.310/2:460134
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000007490233; http://id.ndl.go.jp/bib/000007490233
• RLIN番号: DCGD55949465-B
• 整理区分コード: 281