5th international symposium on quality electronic design : proceedings : 22-24 March 2004 San Jose, California. : 5th IEEE international symposium on quality electronic design : Mar 2004, San Jose, CA.

• 資料種別: 図書
• ISBN: 0769520936
• タイトル: 5th international symposium on quality electronic design : proceedings : 22-24 March 2004 San Jose, California. : 5th IEEE international symposium on quality electronic design : Mar 2004, San Jose, CA.
• 著者標目: International Symposium on Quality Electronic Design (5th : 2004 : San Jose, Calif.)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2004.
• 出版年（W3CDTF）: 2004
• 数量: xxi, 550 p. : ill. ; 28 cm.
• 並列タイトル等: Proceedings of the ISQED 2004
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Reliability -- Congresses.; Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Integrated circuits -- Very large scale integration -- Computer-aided design -- Congresses.; Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
• NDLC: M17
• 一般注記: Program, abstracts, and papers.; IEEE cat no P2093.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-04-3408
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000007516730; http://id.ndl.go.jp/bib/000007516730
• LC control number: 2003116307; https://lccn.loc.gov/2003116307
• RLIN番号: CSUGA5610279-B
• 整理区分コード: 215