数量xv, 471 p. : ill. ; 24 cm.
一般注記Papers.
"This volume is the joint proceedings of papers presented in Symposium D, 'High-k Insulators and Ferroelectrics for Advanced Microelectronic Devices, ' and Symposium E, 'Integration Challenges in Next-Generation Oxide-Based Nanoelectronics, ' held April 13-16 at the 2004 MRS Spring Meeting in San Francisco, California." -- p. xv.
書誌注記Includes bibliographical references and indexes.