図書

Expo issue : microscopy & microanalysis 2005 : 63rd annual meeting of the Microscopy Society of America : 39th annual meeting of the Microbeam Analysis Society : 38th annual meeting of the International Metallographic Society : (...) : Honolulu, Hawaii, USA : July 31-August 4, 2005. : M&M 2005 meeting : international microscopy and microanalysis 2005 meeting : special presidential symposium, "the golden anniversary of imaging atoms" : 38th annual convention of the International Metallographic Society : Jul 2005, Honolulu, HI. (Microscopy and Microanalysis ; 11 Suppl 1)

図書を表すアイコン

Expo issue : microscopy & microanalysis 2005 : 63rd annual meeting of the Microscopy Society of America : 39th annual meeting of the Microbeam Analysis Society : 38th annual meeting of the International Metallographic Society : (...) : Honolulu, Hawaii, USA : July 31-August 4, 2005. : M&M 2005 meeting : international microscopy and microanalysis 2005 meeting : special presidential symposium, "the golden anniversary of imaging atoms" : 38th annual convention of the International Metallographic Society : Jul 2005, Honolulu, HI.

(Microscopy and Microanalysis ; 11 Suppl 1)

国立国会図書館請求記号
M17-05-2049
国立国会図書館書誌ID
000007853816
資料種別
図書
著者
-
出版者
Cambridge University Press
出版年
2005.
資料形態
紙
ページ数・大きさ等
189 p. : ill. (some col.) ; 28 cm.
NDC
-
すべて見る

資料に関する注記

一般注記：

Abstracts and program.Title on cover.Includes indexes.

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紙

資料種別
図書
ISSN（シリーズ）
1431-9276
タイトル
Expo issue : microscopy & microanalysis 2005 : 63rd annual meeting of the Microscopy Society of America : 39th annual meeting of the Microbeam Analysis Society : 38th annual meeting of the International Metallographic Society : (...) : Honolulu, Hawaii, USA : July 31-August 4, 2005. : M&M 2005 meeting : international microscopy and microanalysis 2005 meeting : special presidential symposium, "the golden anniversary of imaging atoms" : 38th annual convention of the International Metallographic Society : Jul 2005, Honolulu, HI.
シリーズタイトル
Microscopy and Microanalysis ; 11 Suppl 1
出版事項
[West Nyack] : Cambridge University Press
出版年月日等
2005.
出版年（W3CDTF）
2005
数量
189 p. : ill. (some col.) ; 28 cm.
並列タイトル等
Expo issue : microscopy and microanalysis 2005 : 63rd annual meeting of the Microscopy Society of America : 39th annual meeting of the Microbeam Analysis Society : 38th annual meeting of the International Metallographic Society : (...) : Honolulu, Hawaii, USA : July 31-August 4, 2005
Microscopy and microanalysis : volume 11, supplement 1, 2005 : pages 1-192
出版地（国名コード）
US