23rd IEEE VLSI test symposium : proceedings : 1-5 May 2005 : Palm Springs, California. : VTS conference : TTTC test technology educational program (TTEP) 2005 : May 2005, Palm Springs, CA.

• 資料種別: 図書
• ISBN: 0769523145
• ISSN: 1093-0167
• タイトル: 23rd IEEE VLSI test symposium : proceedings : 1-5 May 2005 : Palm Springs, California. : VTS conference : TTTC test technology educational program (TTEP) 2005 : May 2005, Palm Springs, CA.
• 著者標目: IEEE VLSI Test Symposium (23rd : 2005 : Palm Springs, Calif.)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2005.
• 出版年（W3CDTF）: 2005
• 数量: xxv, 455 p. : ill. ; 28 cm.
• 並列タイトル等: IEEE test symposium : 2005 : VLSI : without testing it's a gamble; VTS05
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Testing. -- Congresses.
• NDLC: M17
• 一般注記: Papers and abstracts.; "Welcome to VTS 2005, the twenty-third in a series of annual symposia (...) " -- foreword.; "Full-day tutorials and workshops are also held in conjunction with VTS 2005." -- foreword.; IEEE cat no P2314.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-06-2720
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000008336033; http://id.ndl.go.jp/bib/000008336033
• RLIN番号: MOHG60579760-B
• 整理区分コード: 215