Twenty second annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2006 : Dallas, TX USA : March 14-16, 2006. : SEMI-THERM 22 : 22nd IEEE semiconductor thermal management, modeling and measurement symposium : Mar 2006, Dallas, TX.

• 資料種別: 図書
• ISBN: 1424401534 (softbound ed.); 1424401542 (CD-ROM ed.)
• ISSN: 1065-2221
• タイトル: Twenty second annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2006 : Dallas, TX USA : March 14-16, 2006. : SEMI-THERM 22 : 22nd IEEE semiconductor thermal management, modeling and measurement symposium : Mar 2006, Dallas, TX.
• 著者標目: IEEE Semiconductor Thermal Measurement and Management Symposium (22nd : 2006 : Dallas, TX)
• 出版事項: [Piscataway] : IEEE
• 出版年月日等: [c2006]
• 出版年（W3CDTF）: 2006
• 数量: xiv, 239, 1 p. : ill. ; 28 cm.
• 並列タイトル等: 22nd annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2006 : Dallas, TX USA : March 14-16, 2006
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Semiconductors -- Thermal properties -- Congresses.; Semiconductors -- Cooling -- Congresses.
• NDLC: M17
• 一般注記: Program, an abstract and papers.; "The 2006 Semiconductor Thermal Measurement and Management (SEMI-THERM) Symposium is an annual international forum (...) The format of the symposium this year couples ten sessions (...) a more-intimate Poster Session (...) an evening tutorial (...) and a series of Workshops (...) " -- p. [i].; IEEE cat no 06CH37767 (softbound ed.) , 06CH37767C (CD-ROM ed.) .
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-07-1504
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000008580708; http://id.ndl.go.jp/bib/000008580708
• OCLC番号: 74151198; https://www.worldcat.org/oclc/74151198
• 整理区分コード: 215