25th IEEE VLSI test symposium : proceedings : 6-10 May 2007 : Berkeley, California. : VTS 2007 : test technology education program : TTTC test technology educational program (TTEP) 2007 : May 2007, Berkeley, CA.

• 資料種別: 図書
• ISBN: 9780769528120 (ISBN-13); 0769528120
• ISSN: 1093-0167
• タイトル: 25th IEEE VLSI test symposium : proceedings : 6-10 May 2007 : Berkeley, California. : VTS 2007 : test technology education program : TTTC test technology educational program (TTEP) 2007 : May 2007, Berkeley, CA.
• 著者標目: IEEE VLSI Test Symposium (25th : 2007 : Berkeley, Calif.)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2007.
• 出版年（W3CDTF）: 2007
• 数量: xxx, 484 p. : ill. ; 28 cm.
• 並列タイトル等: IEEE test symposium : VLSI : without testing it's a gamble : twenty-fifth anniversary; VTS07
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
• NDLC: M17
• 一般注記: Papers.; "Welcome to VTS 2007, the twenty-fifth in a series of annual symposia (...) " -- foreword.; "Full-day tutorials and workshops are also held in conjunction with VTS 2007." -- foreword.; IEEE cat no P2812.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-07-2969
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000009167406; http://id.ndl.go.jp/bib/000009167406
• OCLC番号: 143990162; https://www.worldcat.org/oclc/143990162
• 整理区分コード: 215