14th IEEE international on-line testing symposium : proceedings : Rhodes, Greece : July 6-9, 2008. : IOLTS 2008 : tutorial on soft errors : IEEE Computer Society Test Technology Technical Council (TTTC) test technology educational program (TTEP) : Jul 2008, Rhodes, Greece.

• 資料種別: 図書
• ISBN: 9780769532646
• タイトル: 14th IEEE international on-line testing symposium : proceedings : Rhodes, Greece : July 6-9, 2008. : IOLTS 2008 : tutorial on soft errors : IEEE Computer Society Test Technology Technical Council (TTTC) test technology educational program (TTEP) : Jul 2008, Rhodes, Greece.
• 著者標目: University of Athens.; IEEE International On-Line Testing Symposium (14th : 2008 : Rhodes, Greece)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2008.
• 出版年（W3CDTF）: 2008
• 数量: xvii, 305 p. : ill. ; 28 cm.
• 並列タイトル等: 2008 14th IEEE international on-line testing symposium
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Electronic circuits -- Testing -- Data processing -- Congresses.; Error-correcting codes (Information theory) -- Congresses.
• NDLC: M17
• 一般注記: Papers.; " (...) and included in the annual and expanding Test Technology Educational Program (TTEP) ." -- p. xvi.; IEEE cat no P3264, CFP08OLT-PRT.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-08-2073
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000009697334; http://id.ndl.go.jp/bib/000009697334
• OCLC番号: 257667173; https://www.worldcat.org/oclc/257667173
• 整理区分コード: 215