26th IEEE VLSI test symposium : proceedings : San Diego, California : 27 April-1 May 2008. : test technology education program (TTEP) : TTTC test technology educational program (TTEP) 2008 : Apr 2008, San Diego, CA.

• 資料種別: 図書
• ISBN: 9780769531236
• ISSN: 1093-0167
• タイトル: 26th IEEE VLSI test symposium : proceedings : San Diego, California : 27 April-1 May 2008. : test technology education program (TTEP) : TTTC test technology educational program (TTEP) 2008 : Apr 2008, San Diego, CA.
• 著者標目: IEEE VLSI Test Symposium (26th : 2008 : San Diego, Calif.)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2008.
• 出版年（W3CDTF）: 2008
• 数量: xxx, 413 p. : ill. ; 28 cm.
• 並列タイトル等: 26th IEEE VLSI test symposium : (VTS 2008) : San Diego, California : 27 April-1 May 2008
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
• NDLC: M17
• 一般注記: Papers and abstracts.; "Welcome to VTS 2008, the twenty-sixth in a series of annual symposia (...) " -- foreword.; "Full-day tutorials and workshops are also held in conjunction with VTS 2008." -- foreword.; IEEE cat no P3123 (t.p. verso) , CFP08029-PRT.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-09-592
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000009774054; http://id.ndl.go.jp/bib/000009774054
• OCLC番号: 235178323; https://www.worldcat.org/oclc/235178323
• 整理区分コード: 215