2008 IEEE international conference on microelectronic test structures : conference proceedings : March 24-27 : the University of Edinburgh, UK. : Mar 2008, Edinburgh, UK.

• 資料種別: 図書
• ISBN: 9781424418008; 9781424418015
• タイトル: 2008 IEEE international conference on microelectronic test structures : conference proceedings : March 24-27 : the University of Edinburgh, UK. : Mar 2008, Edinburgh, UK.
• 著者標目: IEEE International Conference on Microelectronic Test Structures (2008 : University of Edinburgh)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2008.
• 出版年（W3CDTF）: 2008
• 数量: xi, 242 p. : ill. ; 28 cm.
• 並列タイトル等: ICMTS : IEEE international conference on microelectronic test structures; 2008 IEEE international conference on microelectronic test structures : Edinburgh, United Kingdom : 24-27 March 2008
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.; Electronic apparatus and appliances -- Testing -- Congresses.
• NDLC: M17
• 一般注記: Program and papers.; "ICMTS has come of age and this meeting celebrates its 21st anniversary (...) " -- p. iii.; IEEE cat no CFP08MTS-PRT.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-09-1000
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000009978616; http://id.ndl.go.jp/bib/000009978616
• OCLC番号: 281398699; https://www.worldcat.org/oclc/281398699
• 整理区分コード: 215