Stress-induced phenomena in metallization : tenth international workshop on stress-induced phenomena in metallization : Austin, Texas 5-7 November 2008. : 10th stress workshop : Nov 2008, Austin, TX.

• 資料種別: 図書
• ISBN: 9780735406803
• ISSN（シリーズ）: 0094-243X
• タイトル: Stress-induced phenomena in metallization : tenth international workshop on stress-induced phenomena in metallization : Austin, Texas 5-7 November 2008. : 10th stress workshop : Nov 2008, Austin, TX.
• シリーズタイトル: AIP Conference Proceedings ; 1143
• タイトル標目: AIP conference proceedings ; no. 1143.
• 著者標目: Ho, P. S.; Ogawa, Shinʾichi.; Zschech, Ehrenfried.; International Workshop on Stress-Induced Phenomena in Metallization (10th : 2008 : Austin, Texas)
• 出版事項: Melville : American Institute of Physics
• 出版年月日等: 2009.
• 出版年（W3CDTF）: 2009
• 数量: vii, 233 p. : ill. ; 25 cm.
• 並列タイトル等: Stress-induced phenomena in metallization : 10th international workshop on stress-induced phenomena in metallization : Austin, Texas 5-7 November 2008
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Interconnects (Integrated circuit technology) -- Defects -- Congresses.; Metal-metal bonds -- Congresses.; Strength of materials -- Congresses.; Nanostructured materials -- Congresses.; Semiconductors -- Congresses.; Copper -- Electric properties -- Congresses.
• LCC: TK7871.85
• NDLC: M17
• 一般注記: Papers.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-10-405
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000010402499; http://id.ndl.go.jp/bib/000010402499
• LC control number: 2009928111; https://lccn.loc.gov/2009928111
• OCLC番号: 426030732; https://www.worldcat.org/oclc/426030732
• 整理区分コード: 215