Microscopy and microanalysis 2009 : proceedings : Microscopy Society of America 67th annual meeting : Microbeam Analysis Society 43rd annual meeting : International Metallographic Society 42nd annual meeting : Richmond, Virginia : July 26-July 30, 2009.

• 資料種別: 図書
• タイトル: Microscopy and microanalysis 2009 : proceedings : Microscopy Society of America 67th annual meeting : Microbeam Analysis Society 43rd annual meeting : International Metallographic Society 42nd annual meeting : Richmond, Virginia : July 26-July 30, 2009.
• シリーズタイトル: Microscopy and Microanalysis ; 15 Suppl 2
• 著者標目: Microscopy Society of America.
• 出版事項: Cambridge : Cambridge University Press
• 出版年月日等: 2009.
• 出版年（W3CDTF）: 2009
• 数量: lxvii, 178 p. : ill. ; 29 cm.
• 付属資料: With a CD-ROM.
• 並列タイトル等: Microscopy and microanalysis 2009 : proceedings : Microscopy Society of America 67th annual meeting : Microbeam Analysis Society 43rd annual meeting : International Metallographic Society 42nd annual meeting : Richmond, Virginia, USA : July 26-30, 2009
• その他のタイトル: 2009 MSA : 2009 MAS : IMS 2009 conference : Jul 2009, Richmond, VA.
• 出版地（国名コード）: GB
• NDLC: M17
• 一般注記: Abstracts and papers.; "The scientific program (...) feature over 30 symposia (...) Other program highlights include a set of 'Back to Basics' Tutorials, and continuations of the highly successful In-Meeting Intensive Workshops, (...) " -- foreword.
• 書誌注記: Includes bibliographical references and indexes.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-10-1055
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000010586526; http://id.ndl.go.jp/bib/000010586526
• 整理区分コード: 215