Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics -- 2009 : symposium held April 14-17, 2009, San Francisco, California, U.S.A. : symposium D, "materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics -- 2009" : 2009 MRS spring meeting : Apr 2009, San Francisco, CA.

• 資料種別: 図書
• ISBN: 9781605111292
• タイトル: Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics -- 2009 : symposium held April 14-17, 2009, San Francisco, California, U.S.A. : symposium D, "materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics -- 2009" : 2009 MRS spring meeting : Apr 2009, San Francisco, CA.
• シリーズタイトル: Materials Research Society Symposia Proceedings ; 1156
• タイトル標目: Materials Research Society symposia proceedings ; v. 1156.
• 著者標目: Gall, Martin.; Materials Research Society. Meeting (2009 : San Francisco, Calif.); Symposium D, "Materials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics" (2009 : San Francisco, Calif.)
• 出版事項: Warrendale : Materials Research Society
• 出版年月日等: c2009.
• 出版年（W3CDTF）: 2009
• 数量: viii, 189 p. : ill. ; 24 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Interconnects (Integrated circuit technology) -- Congresses.; Integrated circuits -- Very large scale integration -- Congresses.; Microelectronics -- Congresses.; Nanoelectronics -- Congresses.; Materials -- Congresses.
• LCC: TK7874.53
• NDLC: M17
• 一般注記: Papers.
• 書誌注記: Includes bibliographical references and indexes.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-10-1685
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000010640925; http://id.ndl.go.jp/bib/000010640925
• OCLC番号: 472656469; https://www.worldcat.org/oclc/472656469
• 整理区分コード: 215