ISBN9783642149795 (ISBN-13 : pbk.)
3642149790 (pbk.)
数量xv, 758 p. : ill. ; 24 cm.
並列タイトル等Structural, syntactic, and statistical pattern recognition : joint IAPR international workshop, SSPR and SPR 2010 : Cesme, Izmir, Turkey, August 18-20, 2010 : proceedings
S+SSPR 2010
一般注記Papers.
" (...) S+SSPR 2010 Workshops, which was the seventh occasion that SPR and SSPR workshops have been held jointly." -- pref.
書誌注記Includes bibliographical references and author index.