Twenty fifth annual IEEE semiconductor thermal measurement and management symposium : proceedings 2009 : San Jose, CA USA : March 15-19, 2009. : SEMI-THERM 25 : Semi-Therm conference : Mar 2009, San Jose, CA.

• 資料種別: 図書
• ISBN: 9781424436644
• ISSN: 1065-2221
• タイトル: Twenty fifth annual IEEE semiconductor thermal measurement and management symposium : proceedings 2009 : San Jose, CA USA : March 15-19, 2009. : SEMI-THERM 25 : Semi-Therm conference : Mar 2009, San Jose, CA.
• 著者標目: IEEE Semiconductor Thermal Measurement and Management Symposium (25th : 2009 : San Jose, Calif.)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2009.
• 出版年（W3CDTF）: 2009
• 数量: 335 p. : ill. ; 28 cm.
• 並列タイトル等: 25th annual IEEE semiconductor thermal measurement and management symposium : proceedings 2009 : San Jose, CA USA : March 15-19, 2009; 2009 twenty-fifth annual IEEE semiconductor thermal measurement and management symposium : (SEMI-THERM) : San Jose, California, USA : 15-19 March 2009
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Semiconductors -- Thermal properties -- Congresses.; Semiconductors -- Cooling -- Congresses.
• LCC: TK7871.85
• NDLC: M17
• 一般注記: An abstract and papers.; "The rest of the conference features (...) evening tutorials and vendor exhibits and presentations." -- welcome to SEMI-THERM'25.; IEEE cat no CFP09SEM-PRT.
• 書誌注記: Includes bibliographical references.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-11-184
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000011009241; http://id.ndl.go.jp/bib/000011009241
• OCLC番号: 495724502; https://www.worldcat.org/oclc/495724502
• 整理区分コード: 215