2010 IEEE instrumentation & measurement technology conference : (I2MTC 2010) : Austin, Texas, USA : 3-6 May 2010. : I[2]MTC 2010 : May 2010, Austin, TX.

• 資料種別: 図書
• ISBN（セット）: 9781424428328 (set)
• ISSN: 1091-5281
• タイトル: 2010 IEEE instrumentation & measurement technology conference : (I2MTC 2010) : Austin, Texas, USA : 3-6 May 2010. : I[2]MTC 2010 : May 2010, Austin, TX.
• 著者標目: Institute of Electrical and Electronics Engineers. Central Texas Section.; IEEE International Instrumentation and Measurement Technology Conference (27th : 2010 : Austin, Tex.)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2010.
• 出版年（W3CDTF）: 2010
• 数量: 2 v. : ill. ; 27 cm.
• 並列タイトル等: 2010 IEEE instrumentation and measurement technology conference : (I2MTC 2010) : Austin, Texas, USA : 3-6 May 2010
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Electronic measurements -- Congresses.; Electronic instruments -- Congresses.; Engineering instruments -- Congresses.; Measurement -- Congresses.; Physical measurements -- Congresses.
• LCC: TK7878
• NDLC: M17
• 一般注記: Program and papers.; " (...) (I2MTC) (...) We are thrilled to host this 27th annual gathering of (...) " -- message from the chairpersons.; "The IEEE I[2]MTC 2010 will have a half day of tutorial presentations on Monday, 3 May 2010." -- p. lxv.; IEEE cat no CFP10IMT-PRT.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-11-1772
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000011164651; http://id.ndl.go.jp/bib/000011164651
• OCLC番号: 688537599; https://www.worldcat.org/oclc/688537599
• 整理区分コード: 215

• 内容細目: 1: Pages 1-8142: Pages 815-1627.（提供元: 国立国会図書館蔵書）