2006 IEEE international test conference : Santa Clara, CA : 22-27 October 2006. : ITC : 37th annual international test conference : Oct 2006, Santa Clara, CA.

• 資料種別: 図書
• ISBN（セット）: 1424402913 (set)
• ISSN: 1089-3539
• タイトル: 2006 IEEE international test conference : Santa Clara, CA : 22-27 October 2006. : ITC : 37th annual international test conference : Oct 2006, Santa Clara, CA.
• 著者標目: International Test Conference (37th : 2006 : Santa Clara, Calif.)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2006.
• 出版年（W3CDTF）: 2006
• 数量: 2 v. : ill. ; 27 cm.
• 並列タイトル等: 2006 IEEE international test conference : Santa Clara, CA, USA : 22-27 October 2006
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Telecommunication -- Congresses.; Radio frequency -- Congresses.
• LCC: TK7874
• DDC: 621.3815/48
• NDLC: M17
• 一般注記: Abstracts and papers.; "ITC is (...) the cornerstone of an entire week of test-related events known as ITC Test Week." -- welcome message.; "Test Week consists of two days of tutorials, three days of the conference and two days of workshops." -- welcome message.; "ITC Test Week begins with a slate of 17 tutorials (...) Test Week concludes with three workshops." -- welcome message.; IEEE cat no 06CH37787.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-11-3402
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000011237125; http://id.ndl.go.jp/bib/000011237125
• LC control number: 2007275204; https://lccn.loc.gov/2007275204
• OCLC番号: 163606299; https://www.worldcat.org/oclc/163606299
• 整理区分コード: 215