その他のタイトル2010 5th IEEE international workshop on systematic approaches to digital forensic engineering : (SADFE 2010) : Oakland, California, USA : 20 May 2010.
5th annual IEEE workshop on systematic approaches to digital forensics engineering : IEEE/SADFE '10 : May 2010, Oakland, CA.
一般注記Abstracts and papers.
"This is the third workshop held in conjunction with IEEE [sic] Security and Privacy." -- p. vii.
IEEE cat no CFP10400-PRT.
書誌注記Includes bibliographical references and author index.