2010 fifth IEEE international workshop on systematic approaches to digital forensic engineering : (SADFE 2010) : Oakland, California, USA : 20 May 2010 : 5th annual IEEE workshop on systematic approaches to digital forensics engineering : IEEE/SADFE '10 : May 2010, Oakland, CA.

• 資料種別: 図書
• ISBN: 9781424472208
• タイトル: 2010 fifth IEEE international workshop on systematic approaches to digital forensic engineering : (SADFE 2010) : Oakland, California, USA : 20 May 2010 : 5th annual IEEE workshop on systematic approaches to digital forensics engineering : IEEE/SADFE '10 : May 2010, Oakland, CA.
• 著者標目: International Workshop on Systematic Approaches to Digital Forensic Engineering (5th : 2010 : Oakland, Calif.)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2010.
• 出版年（W3CDTF）: 2010
• 数量: xv, 158 p.
• 形態の詳細: ill.
• 大きさ: 27 cm.
• その他のタイトル: 2010 5th IEEE international workshop on systematic approaches to digital forensic engineering : (SADFE 2010) : Oakland, California, USA : 20 May 2010.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Computer crimes--Investigation--Congresses.; Forensic engineering--Congresses.
• LCC: HV8079.C65
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Abstracts and papers.; "This is the third workshop held in conjunction with IEEE [sic] Security and Privacy." -- p. vii.; IEEE cat no CFP10400-PRT.
• 書誌注記: Includes bibliographical references and author index.
• 一次資料へのリンクURL: IEEE Xplore; http://ieeexplore.ieee.org/servlet/opac?punumber=5491877
• 所蔵機関: 国立国会図書館
• 請求記号: M17-12-740
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000011269645; http://id.ndl.go.jp/bib/000011269645
• 目録規則: 英米目録規則
• 整理区分コード: 215