2010 international symposium on VLSI design, automation and test : (VLSI-DAT 2010) : Hsin Chu, Taiwan : 26-29 April 2010 : Apr 2010, Hsin Chu, Taiwan.

• 資料種別: 図書
• ISBN: 9781424452699 (print)
• タイトル: 2010 international symposium on VLSI design, automation and test : (VLSI-DAT 2010) : Hsin Chu, Taiwan : 26-29 April 2010 : Apr 2010, Hsin Chu, Taiwan.
• 著者標目: International Symposium on VLSI Design, Automation, and Test (2010 : Hsin-chu shih, Taiwan); Lee, Kuen-Jong.; Cheng, Kwang-Ting, 1961-
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2010.
• 出版年（W3CDTF）: 2010
• 数量: 366 p.
• 形態の詳細: ill.
• 大きさ: 27 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits--Very large scale integration--Congresses.
• LCC: TK7874
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Papers and abstracts.; "The VLSI-DAT was spun off from (...) (VLSI-TSA) in 2005. In six years, the VLSI-DAT has emerged into (...) from all over the world attend VLSI-DAT each year." -- welcome message from general co-chairs.; "Also, there are four tutorials (...) during the first day of the symposium." -- welcome message from general co-chairs.; IEEE cat no CFP10847-PRT.
• 書誌注記: Includes bibliographical references and author index.
• 一次資料へのリンクURL: IEEE Xplore; http://ieeexplore.ieee.org/servlet/opac?punumber=5484101
• 所蔵機関: 国立国会図書館
• 請求記号: M17-12-834
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000011274279; http://id.ndl.go.jp/bib/000011274279
• OCLC番号: 692248032; https://www.worldcat.org/oclc/692248032
• 目録規則: 英米目録規則
• 整理区分コード: 215