Advances in spectroscopy and imaging of surfaces and nanostructures : symposium held November 29-December 3, Boston, Massachusetts, U.S.A. : symposium SS: "advanced imaging and scattering techniques for in situ studies", TT: "in situ x-ray synchrotron radiation spectroscopies in energy-related materials science and heterogeneous catalysis", UU: "real-time studies of evolving thin films and interfaces" and VV: "novel development and applications of scanning probe microscopy" : Nov 2010, Boston, MA.
(Materials Research Society Symposia Proceedings ; 1318)