2011 international conference on optical instruments and technology : solid state lighting and display technologies, holography, speckle pattern interferometry, and micro/nano manufacturing and metrology : 6-9 November 2011 : Beijing, China : holography, speckle pattern interferometry and applications : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8202)

2011 international conference on optical instruments and technology : solid state lighting and display technologies, holography, speckle pattern interferometry, and micro/nano manufacturing and metrology : 6-9 November 2011 : Beijing, China : holography, speckle pattern interferometry and applications : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China.

(SPIE Proceedings ; 8202)

国立国会図書館請求記号: M17-12-3514
国立国会図書館書誌ID: 023462859

資料種別: 図書

著者: International Conference on Optical Instruments and Technology (2011 : Beijing, China)ほか

出版者: SPIE

出版年: c2011.

資料形態: 紙

ページ数・大きさ等: 1 v. (various pagings) ; 28 cm.

NDC: -

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資料に関する注記

一般注記：: Papers.Described as "(...) (OIT2011), held in Beijing, China, 7-9 November 2011." -- introd."The conference was the third event (...)" -- introd.

形態の詳細：: ill.

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書誌情報

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紙

資料種別: 図書
ISBN: 9780819488435
ISSN（シリーズ）: 0277786X
タイトル: 2011 international conference on optical instruments and technology : solid state lighting and display technologies, holography, speckle pattern interferometry, and micro/nano manufacturing and metrology : 6-9 November 2011 : Beijing, China : holography, speckle pattern interferometry and applications : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China.
シリーズタイトル: SPIE Proceedings ; 8202
タイトル標目: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 8202. 0277-786X
著者標目: International Conference on Optical Instruments and Technology (2011 : Beijing, China)
Weber, Larry Francis.
China Instrument and Control Society. Optoelectronic-Mechanic Technology and System Integration Chapter.
出版事項: Bellingham : SPIE
出版年月日等: c2011.
出版年（W3CDTF）: 2011
数量: 1 v. (various pagings)
形態の詳細: ill.
大きさ: 28 cm.
出版地（国名コード）: US
本文の言語コード: eng
件名標目: Light emitting diodes--Congresses.
Semiconductors--Optical properties--Congresses.
Speckle metrology--Congresses.
Nanomanufacturing--Congresses.
Optical instruments
Solid state lighting
Display technologies
Holography
Speckle pattern interferometry
LCC: TK8315
NDLC: M17
対象利用者: 一般
一般注記: Papers.
Described as "(...) (OIT2011), held in Beijing, China, 7-9 November 2011." -- introd.
"The conference was the third event (...)" -- introd.
書誌注記: Includes bibliographical references and author index.
一次資料へのリンクURL: http://link.spie.org/PSISDG/8202/1
所蔵機関: 国立国会図書館
請求記号: M17-12-3514
連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
書誌ID（NDLBibID）: 023462859
http://id.ndl.go.jp/bib/023462859
OCLC番号: 783646003
https://www.worldcat.org/oclc/783646003
目録規則: 英米目録規則
整理区分コード: 215