2013 20th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2013) : Suzhou, China : 15-19 July 2013 : IPFA2013 : Jul 2013, Suzhou, China. CFP13777-PRT
2013 20th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2013) : Suzhou, China : 15-19 July 2013 : IPFA2013 : Jul 2013, Suzhou, China.
国立国会図書館請求記号
M17-14-1212
国立国会図書館書誌ID
025055356
資料種別
図書
著者
International Symposium on the Physical & Failure Analysis of Integrated Circuits (20th : 2013 : Suzhou, China)ほか