2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.

• 資料種別: 図書
• ISBN: 9781479939114
• タイトル: 2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.
• 著者標目: International Symposium on the Physical & Failure Analysis of Integrated Circuits (21st : 2014 : Singapore); Institute of Electrical and Electronics Engineers.; IEEE Singapore Section. Reliability/CPMT/ED Chapter.
• 出版事項: Piscataway, NJ : IEEE (出版)
• 出版年月日等: [2014]; 著作権日付 : ©2014
• 出版年（W3CDTF）: 2014
• 数量: xliv, 389 pages
• 形態の詳細: illustrations
• 大きさ: 27 cm
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 表現種別: text
• 機器種別: unmediated
• キャリア種別: volume
• 件名標目: Integrated circuits--Reliability--Congresses.; Integrated circuits--Testing--Congresses.; Semiconductors--Failures--Congresses.; Integrated circuits--Defects--Congresses.
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Abstracts and papers.; Described as "... at IPFA 2014. Over the next 3 days, 49 oral presentations and ..."--Welcome message.; Described as "IPFA 2014 : 02-04 July 2014 ..."--Page xxxix.; IEEE catalog number CFP14777-POD.
• 書誌注記: Includes bibliographical references.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-15-2494
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 026336379; http://id.ndl.go.jp/bib/026336379
• 目録規則: RDA
• 整理区分コード: 215