Image analysis : 19th Scandinavian conference, SCIA 2015 : Copenhagen, Denmark, June 15-17, 2015 : proceedings : regional meeting of the International Association for Pattern Recognition (IAPR) : Jun 2015, Copenhagen, Denmark.

• 資料種別: 図書
• ISBN: 9783319196640
• ISSN（シリーズ）: 0302-9743
• タイトル: Image analysis : 19th Scandinavian conference, SCIA 2015 : Copenhagen, Denmark, June 15-17, 2015 : proceedings : regional meeting of the International Association for Pattern Recognition (IAPR) : Jun 2015, Copenhagen, Denmark.
• シリーズタイトル: Lecture Notes in Computer Science ; 9127
• タイトル標目: Lecture notes in computer science ; 9127. 0302-9743; LNCS sublibrary. SL 6, Image processing, computer vision, pattern recognition, and graphics.
• 著者標目: Scandinavian Conference on Image Analysis (19th : 2015 : Copenhagen, Denmark); Paulsen, Rasmus R.; Pedersen, Kim Steenstrup.; Pattern Recognition Society of Denmark.; International Association for Pattern Recognition.
• 出版事項: Cham : Springer (出版)
• 出版年月日等: [2015]
• 出版年（W3CDTF）: 2015
• 数量: xv, 544 pages
• 形態の詳細: illustrations
• 大きさ: 24 cm.
• 出版地（国名コード）: CH
• 本文の言語コード: eng
• ジャンル・形式用語: Conference papers and proceedings.
• 表現種別: text
• 機器種別: unmediated
• キャリア種別: volume
• 件名標目: Image analysis--Congresses.; Image processing--Digital techniques--Congresses.; Computer vision--Congresses.; Image Processing and Computer Vision.; Pattern Recognition.; Artificial Intelligence (incl. Robotics).; Computer Graphics.; Computer vision.; Image analysis.; Image processing--Digital techniques.
• LCC: TA1637
• DDC: 006.6
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Papers.; "The SCIA conference series has been an ongoing biannual event ..."--Preface.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-16-387
• 関連情報（DOI）: 10.1007/978-3-319-19665-7
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 026547600; http://id.ndl.go.jp/bib/026547600
• 目録規則: RDA
• 整理区分コード: 215

• 要約等: This book constitutes the refereed proceedings of the 19th Scandinavian Conference on Image Analysis, SCIA 2015, held in Copenhagen, Denmark, in June ...