数量1 volume (various pagings)
並列タイトル等SAR image analysis, modeling, and techniques 15 : 23-24 September 2015 : Toulouse, France
SPIE. remote sensing
資料の内容に関する注記Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
書誌注記Includes bibliographical references and author index.
標準番号(その他)International Article Number : 9781628418521