ISBN9781509018284 (Print-On-Demand)
一般注記Papers.
Described as "2016 IEEE International Conference on Software Testing, Verification and Validation : Proceedings : 10-15 April 2016 : Chicago, Illinois"--Page iv.
"The ICST 2016 program includes ... nine co-located events (InSTA, IWCT, Mutation, A-MOST and TAIC PART workshops, poster session, Ph.D. symposium, three tutorials, and industry presentations with tool demos)."--Page ix.
IEEE catalog number CFP16TVV-POD.
書誌注記Includes bibliographical references and author index.