2016 21st IEEE European test symposium (ETS 2016) : Amsterdam, Netherlands : 23-27 May 2016 : May 2016, Amsterdam, the Netherlands.

• 資料種別: 図書
• ISBN: 9781467396608 (print-on-demand)
• ISSN: 1530-1877
• タイトル: 2016 21st IEEE European test symposium (ETS 2016) : Amsterdam, Netherlands : 23-27 May 2016 : May 2016, Amsterdam, the Netherlands.
• 著者標目: IEEE European Test Symposium (21st : 2016 : Amsterdam, the Netherlands); Delft University of Technology.
• 出版事項: Piscataway, NJ : IEEE (出版)
• 出版年月日等: [2016]; 著作権日付 : ©2016
• 出版年（W3CDTF）: 2016
• 数量: 220 pages
• 形態の詳細: illustrations
• 大きさ: 28 cm
• 出版地（国名コード）: US
• 本文の言語コード: eng
• ジャンル・形式用語: Conference papers and proceedings.
• 表現種別: text
• 機器種別: unmediated
• キャリア種別: volume
• 件名標目: Integrated circuits--Testing--Congresses.; Automatic test equipment--Congresses.; Electronic digital computers--Circuits--Testing--Congresses.; Electronic digital computers--Circuits--Testing.; Integrated circuits--Testing.; Automatic test equipment.
• LCC: TK7874
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Abstracts and selected papers.; Described as "ETS'16 ... by starting on Monday, May 23rd with TSS tutorials, followed by a three-day technical program, ... and by ending on Friday, May 27th with a workshop."--ETS 2016 foreword.; "For the seventh time, the Test Spring School (TSS) is also organized back-to-back with ETS."--ETS 2016 foreword.; "The symposium's technical program consists of ... four embedded tutorials, ..."--ETS 2016 foreword.; IEEE catalog number CFP16216-POD.
• 資料の内容に関する注記: Annotation
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-18-1581
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 028452719; http://id.ndl.go.jp/bib/028452719
• 目録規則: RDA
• 整理区分コード: 215