2017 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 28-30 October 2017 : Beijing, China : OIT 2017: optoelectronic measurement technology and systems conference : Oct 2017, Beijing, China.
(SPIE Proceedings ; 10621)
国立国会図書館請求記号
M17-19-1257
国立国会図書館書誌ID
029004341
資料種別
図書
著者
International Conference on Optical Instruments and Technology (2017 : Beijing, China)ほか