数量1 volume (various pagings)
並列タイトル等Modeling aspects in optical metrology 7 : 24-26 June 2019 : Munich, Germany
Modeling aspects in optical metrology VII : at SPIE optical metrology : 24-26 June 2019 : Munich, Germany
一般注記Papers.
"The conference, Modelling Aspects in Optical Metrology 2019, was organised for the seventh time as part of the SPIE Optical Metrology symposium, which ..."--Introduction.
書誌注記Includes bibliographical references and author index.