Diffusion and defect data : solid state data

• 資料種別: 図書
• タイトル: Diffusion and defect data : solid state data
• 出版事項: Sci-Tech Publications; Scitec Publications
• 出版地（国名コード）: sz
• 対象利用者: 一般
• 一般注記: Pt. A: Defect and diffusion forum (ISSN 1012-0386); Pt. B: Solid state phenomena (ISSN 1012-0394)
• 関連情報: Dx centers-donors in AlGaAs and related compounds; https://cir.nii.ac.jp/crid/1130000793913758464; Polycrystalline semiconductors VI : materials, technologies, and large area electronics : proceedings of the sixth International Conference, Saint Malo, September 3-7, 2000; https://cir.nii.ac.jp/crid/1130000794149634816; Ion implantation in semiconductors; https://cir.nii.ac.jp/crid/1130000794182956160; Defect and diffusion forum; https://cir.nii.ac.jp/crid/1130000794278452480; Interfacial effects and novel properties of nanomaterials : Symposium C : proceedings of the Symposium on Interfacial Effects in Nanostructured Materials, Warsow, Poland, 14th - 18th, September, 2002; https://cir.nii.ac.jp/crid/1130000794387224064; Magnesium diboride sourcebook; https://cir.nii.ac.jp/crid/1130000794406033024; Sintering of multiphase metal and ceramic systems : proceedings of the international conference held in New Delhi, 31st January-3rd February, 1989; https://cir.nii.ac.jp/crid/1130000794449723264; Materials under irradiation; https://cir.nii.ac.jp/crid/1130000794556266752; Polycrystalline semiconductors V : bulk materials, thin films and devices : proceedings of the Fifth International Conference, held in Schwäbisch Gmünd, Germany, September 13-18, 1998; https://cir.nii.ac.jp/crid/1130000794600895360; Gettering and deffect engineering in the semiconductor technology : GADEST '89 : proceedings of the 3rd International Autumn Meeting held in Garzau, German Democratic Republic, October 8-13, 1989; https://cir.nii.ac.jp/crid/1130000794779619840; Sintering '91 : Proceedings of the Fifth International Symposium on the Science ad Technology of Sintering, held in Vancouver on July 23-26, 1991; https://cir.nii.ac.jp/crid/1130000795118361216; Defects and diffusion in ceramics : an annual retrospective I; https://cir.nii.ac.jp/crid/1130000795356267648; The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988; https://cir.nii.ac.jp/crid/1130000795461988736; Gettering and deffect engineering in semiconductor technology : GADEST '91 : proceedings of the 4th International Autumn Meeting held in Chossewitz, near Frankfurt(Oder), Germany, October 13-19 1991; https://cir.nii.ac.jp/crid/1130000795579228800; Ultra clean processing of silicon surfaces 2000 : proceedings of the Fifth International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000), held in Ostend, Belgium, September 18-20, 2000; https://cir.nii.ac.jp/crid/1130000796107521024; Diffusion and reactions : from basics to applications : proceedings of the International Conference held in Kraków, Warsaw, Poland, September 7-9, 1994; https://cir.nii.ac.jp/crid/1130000796156316928; Dislocations 93 : microstructures and physical properties : proceedings of the International Meeting held in Aussois (France), March 31 - April 9, 1993; https://cir.nii.ac.jp/crid/1130000796357443968; Gettering and deffect engineering in semiconductor technology XIII: GADEST 2009 : proceedings of the XIIIth International Autumn Meeting, Döllnsee-Schorfheide, north of Berlin, Germany, September 26 - October 02, 2009; https://cir.nii.ac.jp/crid/1130000796372461952; Diffusion and reactions : proceedings of the 2nd International Conference, held in Zakopane, Poland, Sept. 14-18, 1999; https://cir.nii.ac.jp/crid/1130000796426143360; Ultra clean processing of silicon surfaces : proceedings of the Fourth International Symposium on ultra clean processing of silicon surfaces held in Ostend, Belgium, September 21-23, 1998; https://cir.nii.ac.jp/crid/1130000796484709888; Semiconductor materials and technology : proceedings of the 3rd Intl. Conference and Intensive Tutorial Course on Semiconductor Materials and Technology, ICSMT'96, New Delhi, India, December 1996; https://cir.nii.ac.jp/crid/1130000796497758592; Light emission from silicon : INSEL 96 Conference, University of Rome 'La Sapienza' - Rome, Italy, November 11-12, 1996; https://cir.nii.ac.jp/crid/1130000796576227456; Non linear phenomena in materials science; https://cir.nii.ac.jp/crid/1130000796790450048; Gettering and deffect engineering in semiconductor technology : GADEST '93 : proceedings of the 5th International Autumn Meeting held in Chossewitz, near Frankfurt(Oder), Germany, October 09-14, 1993; https://cir.nii.ac.jp/crid/1130000797295268096; Surface segregation; https://cir.nii.ac.jp/crid/1130000797390450432; Gettering and deffect engineering in semiconductor technology : GADEST '99 : proceedings of the 8th International Autumn Meeting : Höör, Schweden, September 25-28 1999; https://cir.nii.ac.jp/crid/1130000797665327872; Soft chemistry leading to novel materials; https://cir.nii.ac.jp/crid/1130000798155412736; Advances in surface research : adsorbate diffusion, surface characterization and mobility : proceedings of the Surface Physics Symposium "25 years of cooperation between the Universities of Wroclaw and Leipzig" Leipzig GDR, September 1989; https://cir.nii.ac.jp/crid/1130000798335708800; Polycrystalline semiconductors III : physics and technology : proceedings of the Third International Conference, Saint Malo, France, September 5-10, 1993; https://cir.nii.ac.jp/crid/1130000798360220160; Diffusion in GaAs and other III-V semiconductors : 10 years of research; https://cir.nii.ac.jp/crid/1130282268649466496; Physics of DX centers in GaAs alloys; https://cir.nii.ac.jp/crid/1130282269076821120; Grain boundary diffusion and grain boundary segregation : proceedings of the International Workshop : DiBoS-97, held in Moscow, Russia, May 1997; https://cir.nii.ac.jp/crid/1130282269077822464; Band tailings and deep defects in semiconductors; https://cir.nii.ac.jp/crid/1130282269146252416; Diffusion in materials : DIMAT-96 : proceedings of the International Conference on Diffusion in Materials, held in Nordkirchen, Germany, 5th-9th August, 1996; https://cir.nii.ac.jp/crid/1130282269342520448; Ion implantation 1988; https://cir.nii.ac.jp/crid/1130282269411469056; Proceedings of DIMAT 2000 : the fifth International Conference on Diffusion in Materials, Paris, France, July 17-21, 2000; https://cir.nii.ac.jp/crid/1130282269459958144; Systems with fast ionic transport - IV : proceedings of the Fourth International Symposium on Systems with Fast Ionic Transport, Warsaw, Poland, May 10-14, 1994; https://cir.nii.ac.jp/crid/1130282269777816064; Polycrystalline semiconductors IV : physics, chemistry and technology : proceedings of the Fourth International Conference, Gargnano, Italy, September 9-14, 1995; https://cir.nii.ac.jp/crid/1130282269841367936; Catastrophe theory and phase transitions : topological aspects of phase transitions and critical phenomena; https://cir.nii.ac.jp/crid/1130282269897277824; Dislocation theory : a five-year retrospective; https://cir.nii.ac.jp/crid/1130282270099493120; Applications of atomic diffusion in solids : nanoscopic electron-affected stochastic dynamics : the compensation effect, diffusion-melting correlations, material instabilities and evolution; https://cir.nii.ac.jp/crid/1130282270114571392; Diffusion in materials : DIMAT-92 : proceedings of the International Conference on Diffusion in Materials held in Kyoto, Japan, 7th-11th September, 1992; https://cir.nii.ac.jp/crid/1130282270278934784; Interfaces and plasticity : proceedings of the Advanced School Meeting "Dislocations 96" held in Tozeur, Tunisia, October 1996 = Interfaces et plasticité; https://cir.nii.ac.jp/crid/1130282270348961024; Polycrystalline semiconductors VII : proceedings of the seventh international conference, Nara, September 10-13, 2002; https://cir.nii.ac.jp/crid/1130282270512024960; Diffusion in silicon : 10 years of research; https://cir.nii.ac.jp/crid/1130282270834832768; Diffusion in metals and alloys : DIMETA 88 : proceedings of the International Conference on Diffusion in Metals and Alloys held in Balatonfüred, Hungary, September 5-9, 1988; https://cir.nii.ac.jp/crid/1130282271115598720; Defects and Diffusion in Metals : Five Years of Research & Annual Retrospective I; https://cir.nii.ac.jp/crid/1130282271348530304; Defects and diffusion in metals III : annual retrospective III; https://cir.nii.ac.jp/crid/1130282271451008128; Beam injection assessment of defects in semiconductors : proceedings of the 5th workshop on beam injection assessment of defects in semiconductors held in Parkhotel Schloss Wulkow near Berlin, Germany, August 30-September 3, 1998; https://cir.nii.ac.jp/crid/1130282271572078464; Diffusion in ceramics : 10 years of research; https://cir.nii.ac.jp/crid/1130282271714341376; Instabilities and patterning : proceedings of the Indo-French Workshop on Instabilities and Patterning and of the International Meeting on Non Linear Phenomena in Materials Science, held in Bangalore, India, December 1994; https://cir.nii.ac.jp/crid/1130282271854350592; Gettering and deffect engineering in semiconductor technology : GADEST '95 : proceedings of the 6th International Autumn Meeting, held in Parkhotel Schloß Wulkow, near Berlin, Germany, September 02-07, 1995; https://cir.nii.ac.jp/crid/1130282272030028928; Diffusion in materials 2011 : selected, peer reviewed papers from the International Conference on Diffusion in Materials (DIMAT 2011), July 3-8, 2011, Dijon France; https://cir.nii.ac.jp/crid/1130282272263569536; Defects and diffusion in metals : annual retrospective II; https://cir.nii.ac.jp/crid/1130282272768555264; Hydrogenated amorphous silicon; https://cir.nii.ac.jp/crid/1130282273088942464; Defects and diffusion in ceramics : an annual retrospective XII; https://cir.nii.ac.jp/crid/1130282273105297152; Gettering and defect engineering in semiconductor technology : GADEST 2003 : proceedings of the 10th International Autumn Meeting, Seehotel Zeuthen (suburb of Berlin) State of Brandenburg, Germany, September 21-26, 2003; https://cir.nii.ac.jp/crid/1130282273283619712
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA07841800#entity
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA07841800 : BA07841800