23rd annual proceedings : Reliability Physics 1985, Orland, Florida, March 26, 27, 28, 1985

• 資料種別: 図書
• タイトル: 23rd annual proceedings : Reliability Physics 1985, Orland, Florida, March 26, 27, 28, 1985
• 著者・編者: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
• 著者標目: International Reliability Physics Symposium; https://ci.nii.ac.jp/author/DA11572276; IEEE Electron Devices Society; https://ci.nii.ac.jp/author/DA01257512; IEEE Reliability Society; https://ci.nii.ac.jp/author/DA03215295
• 出版事項: Electron Device and Reliability Societies of the Institute of Electrical and Electronics Engineers
• 出版年月日等: c1985
• 出版年（W3CDTF）: 1985
• 大きさ: 28 cm
• 並列タイトル等: Reliability Physics; Annual proceedings; IEEE 1985 International Reliability Physics
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Electronic apparatus and appliances -- Reliability Congresses; Electronic apparatus and appliances -- Testing Congresses; Integrated circuits -- Reliability Congresses; Integrated circuits -- Testing Congresses
• 対象利用者: 一般
• 一般注記: "1985 International Reliability Physics Symposium"--T.p. verso; General chairman: J.W. Peeples; "IEEE catalog no. 85CH2113-9."; "Library of Congress Catalog Card no. 82-640313."; "A bonus publication from your Reliability Society"--Cover; Includes bibliographical references
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA90167743#entity; https://lccn.loc.gov/82640313
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA90167743 : BA90167743
• LC control number: 82640313; https://lccn.loc.gov/82640313