Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits :softbound

• 資料種別: 図書
• ISBN: 0780351878
• タイトル: Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
• 巻次・部編番号: :softbound
• 著者・編者: edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore
• 著者標目: International Symposium on the Physical & Failure Analysis of Integrated Circuits; https://ci.nii.ac.jp/author/DA1025375X; Chim, Wai Kin; Radhakrishnan, M. K.; https://ci.nii.ac.jp/author/DA10253771; Thong, John T. L.; https://ci.nii.ac.jp/author/DA08128358; IEEE Singapore Section. Reliability/CPMT/EDA Chapter; https://ci.nii.ac.jp/author/DA10253782; IEEE Electron Devices Society; https://ci.nii.ac.jp/author/DA01257512; National University of Singapore. Centre for IC Failure Analysis and Reliability; https://ci.nii.ac.jp/author/DA10253793; Institute of Microelectronics; https://ci.nii.ac.jp/author/DA10253807
• 出版事項: Institute of Electrical and Electronics Engineers
• 出版年月日等: c1999
• 出版年（W3CDTF）: 1999
• 大きさ: 30 cm
• 並列タイトル等: 99TH8394; 7th International Symposium on th Physical & Failure Analysis of Integrated Circuits 1999; IPFA '99
• 出版地（国名コード）: us
• 本文の言語コード: en
• 対象利用者: 一般
• 一般注記: "IEEE catalog number 99TH8394"--T.p. verso; "5-9 July, 1999, Orchard Hotel, Singapore"--Cover; Includes bibliographical references and index
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA48948612#entity; https://lccn.loc.gov/98088539
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA48948612 : BA48948612
• LC control number: 98088539; https://lccn.loc.gov/98088539